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The VPT Rad radiation laboratory is a one-stop shop for integrated electronic component testing solutions. Our services include test program planning, test execution, results evaluation, and full reporting. We coordinate irradiation scheduling and optimize the test plan development and test performance to efficiently and effectively meet customer requirements.

VPT Rad performs RLAT testing to characterize performance changes in devices due to effects of ionizing radiation. Subjected devices evaluated on performance after exposure to Cobalt-60 gamma photons at various increasing levels.

For reference purposes, a sample final RLAT report can be viewed here.

 

 
 

 

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VPT Rad offers expedited solutions for radiation hardness assurance (RHA) and radiation tolerance testing for a wide variety of electronic components, including discretes, mixed signal components, analog and digital ICs and more. With our in-house equipment and extensive expertise, our customers find our turn-key test solutions to be accurate, efficient and convenient.

Below is an abbreviated list showing the part numbers which are currently available for VPT Rad turn-key testing:

Product CategoryPart TypePart NumberPackagesIn-House Test EquipmentDiscreteBJTJANXX2NXXAll Package TypesIn-House Test EquipmentDiscreteMOSFETJANXX2NXXAll Package TypesIn-House Test EquipmentICLinear RegulatorHS-117All Package TypesCustomICSRAMK6R4008V1CTSOPD-10ICOP AmpOP27All Package TypesCustomICADCAD574All Package TypesCustomICSensorsAD590All Package TypesCustomICOscillatorMCM2767-36MAll Package TypesCustom

 
*This is a partial preview only. Please contact us to learn if our expedited testing services are available for your products.
 

 

 
 
Test Engineering Solutions
 

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As a turn-key provider of test solutions, VPT Rad also provides the design and fabrication of test hardware, and the design and development of software for data acquisition.

VPT Rad and its associated entities have been providing test solutions to the Hi-REL component suppliers since 2008.  We offer clients a one-stop shop, including integrated test development solutions such as the following:

  • Software for data management/data parsing and auto-reporting
  • Printed Circuit Board design and fabrication
  • Automated test equipment (ATE) for data acquisition

 
 

 
 

 

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  • Discrete component test systems for incoming inspection
  • Sampling of small signal/high power transistors, diodes, FETs, zeners, IGBTs, SCRs, and triacs (test for most hi-rel test parameters)
  • 1000 VDC / 75 A capabilities

 

 

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  • Memory ICs
  • Op-AMPS
  • Linear Regulators
  • ADC/DACs

 

 

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  • Memories [SRAM, DRAM, FLASH, SDRAM, EEPROM]
  • ASIC, FPGAs, PLDs
  • Microprocessors, DSPs
  • Transistors & discrete components
  • OpAmps/Comparators
  • ADCs, DACs
  • Mixed Signal

 

 
 
Scientific Test Model 5300
 
 
 
 

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  • Discrete Device Tester
  • Model LC-1000 Low Current Deck Attachment
  • Built-in precision

 
 

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